Applications from the field of Semiconductor Analysis - page 1

Optical Characterization of Materials Using Spectroscopy

Guides

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing, Semiconductor Analysis

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Applications

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Improved determinations of residual anions and organic acids to evaluate printed circuit board cleanliness

Applications

| 2023 | Thermo Fisher Scientific

Ion chromatography

Instrumentation

Ion chromatography

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

A Practical Guide for Understanding and Testing Hazardous Substances in Electrical and Electronic Products

Brochures and specifications

| 2026 | Agilent Technologies

GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy

Instrumentation

GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Determination of trace anions in high-nitrate matrices by ion chromatography

Applications

| 2017 | Thermo Fisher Scientific

Ion chromatography

Instrumentation

Ion chromatography

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

Studying nickel deposition with EQCM-D and EC-Raman

Applications

| 2026 | Metrohm

RAMAN Spectroscopy, Electrochemistry, Voltammetry/Coulometry

Instrumentation

RAMAN Spectroscopy, Electrochemistry, Voltammetry/Coulometry

Manufacturer

Metrohm

Industries

Semiconductor Analysis

Monitoring for trace anion contamination in the extracts of electronic components

Applications

| 2017 | Thermo Fisher Scientific

Ion chromatography

Instrumentation

Ion chromatography

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing, Semiconductor Analysis

Determination of an Anionic Fluorochemical Surfactant in a Semiconductor Etch Bath

Applications

| 1998 | Thermo Fisher Scientific

Ion chromatography

Instrumentation

Ion chromatography

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis