Applications from the field of Semiconductor Analysis - page 1

Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500

Applications

| 2011 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Optical Characterization of Materials Using Spectroscopy

Guides

| 2023 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Materials Testing, Semiconductor Analysis

Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

Applications

| 2020 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Applications

| 2011 | Agilent Technologies

UV–VIS spectrophotometry

Instrumentation

UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Materials Testing, Semiconductor Analysis

Determination of trace anions in high-nitrate matrices by ion chromatography

Applications

| 2017 | Thermo Fisher Scientific

Ion chromatography

Instrumentation

Ion chromatography

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

Monitoring for trace anion contamination in the extracts of electronic components

Applications

| 2017 | Thermo Fisher Scientific

Ion chromatography

Instrumentation

Ion chromatography

Manufacturer

Thermo Fisher Scientific

Industries

Materials Testing, Semiconductor Analysis

A Practical Guide for Understanding and Testing Hazardous Substances in Electrical and Electronic Products

Brochures and specifications

| 2026 | Agilent Technologies

GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy

Instrumentation

GC/MSD, LC/MS, LC/MS/MS, ICP-OES, AAS, ICP/MS, UV–VIS spectrophotometry, GC/MS/MS, GC/HRMS, LC/TOF, LC/HRMS, GC/Q-TOF, GC/QQQ, LC/QQQ, LC/SQ, HPLC, FTIR Spectroscopy

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Determination of anions on the surface of printed circuit boards by IPC-TM-650 Method 2.3.28 using HPIC

Applications

| 2022 | Thermo Fisher Scientific

Ion chromatography

Instrumentation

Ion chromatography

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

Determination of trace anions in basic solutions by single pass AutoNeutralization and ion chromatography

Applications

| 2020 | Thermo Fisher Scientific

Ion chromatography

Instrumentation

Ion chromatography

Manufacturer

Thermo Fisher Scientific

Industries

Energy & Chemicals , Semiconductor Analysis

Determination of trace anions in concentrated glycolic acid

Applications

| 2017 | Thermo Fisher Scientific

Ion chromatography

Instrumentation

Ion chromatography

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis