Applications from the field of Semiconductor Analysis | LabRulez ICPMS

The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

Applications

| N/A | ZOEX/JSB

GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software

Instrumentation

GCxGC, GC/MSD, GC/HRMS, GC/TOF, Software

Manufacturer

JEOL, ZOEX/JSB

Industries

Materials Testing, Semiconductor Analysis

AccuTOF GC series Applications Notebook

Applications

| 2016 | JEOL

GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF

Instrumentation

GC, GCxGC, GC/HRMS, SPME, Thermal desorption, Pyrolysis, GC/TOF

Manufacturer

Agilent Technologies, JEOL

Industries

Environmental, Food & Agriculture, Forensics , Energy & Chemicals , Materials Testing, Semiconductor Analysis , Others

UV Degradation Analysis of Material for Solar Cell Modules Using GC/MS and FTIR

Applications

| 2018 | Shimadzu

GC/MSD, Pyrolysis, GC/SQ

Instrumentation

GC/MSD, Pyrolysis, GC/SQ

Manufacturer

Shimadzu, Frontier Lab

Industries

Materials Testing, Semiconductor Analysis

Phthalate Analysis in Accordance with an IEC Standard Method

Applications

| N/A | CDS Analytical

GC/MSD, Pyrolysis

Instrumentation

GC/MSD, Pyrolysis

Manufacturer

CDS Analytical

Industries

Semiconductor Analysis

Thermal Desorption Analysis of Si Wafer Contaminants

Applications

| N/A | GL Sciences

GC/MSD, Thermal desorption, GC/SQ

Instrumentation

GC/MSD, Thermal desorption, GC/SQ

Manufacturer

Shimadzu, CTC Analytics, GL Sciences

Industries

Semiconductor Analysis

Py-GC/MS Analysis of Electronic Circuit Board Parts Using Nitrogen Carrier Gas

Applications

| 2016 | Shimadzu

GC/MSD, Pyrolysis, GC/SQ

Instrumentation

GC/MSD, Pyrolysis, GC/SQ

Manufacturer

Shimadzu, Frontier Lab

Industries

Semiconductor Analysis

The power of exact mass measurement: an example of unknown compound identification

Applications

| 2006 | JEOL

GC/MSD, GC/TOF

Instrumentation

GC/MSD, GC/TOF

Manufacturer

Agilent Technologies, JEOL

Industries

Materials Testing, Semiconductor Analysis

Detection of molecular ions from OLED material using AccuTOF GC

Applications

| 2006 | JEOL

GC/MSD, GC/TOF

Instrumentation

GC/MSD, GC/TOF

Manufacturer

JEOL

Industries

Materials Testing, Semiconductor Analysis

On-Line Thermal Desorption Analysis As Replacement for Solvent Extraction Methods

Applications

| N/A | CDS Analytical

GC, Thermal desorption

Instrumentation

GC, Thermal desorption

Manufacturer

Buck Scientific, CDS Analytical

Industries

Semiconductor Analysis

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

Applications

| 2015 | Agilent Technologies

GC, Speciation analysis, ICP/MS/MS

Instrumentation

GC, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Semiconductor Analysis

Applications from the field of Semiconductor Analysis | LabRulez ICPMS

The use of Kendrick mass defect plots, a new feature in GC Image™ software for GC x GC/high resolution mass spectrometric data analysis: an application on the identification of halogenated contaminants in electronic waste

AccuTOF GC series Applications Notebook

UV Degradation Analysis of Material for Solar Cell Modules Using GC/MS and FTIR

Phthalate Analysis in Accordance with an IEC Standard Method

Thermal Desorption Analysis of Si Wafer Contaminants

Py-GC/MS Analysis of Electronic Circuit Board Parts Using Nitrogen Carrier Gas

The power of exact mass measurement: an example of unknown compound identification

Detection of molecular ions from OLED material using AccuTOF GC

On-Line Thermal Desorption Analysis As Replacement for Solvent Extraction Methods

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

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