Applications from the field of Semiconductor Analysis - page 7

Determination of challenging elements in ultrapure semiconductor grade sulfuric acid by Triple Quadrupole ICP-MS

Applications
| 2015 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Analysis of photovoltaic grade silicon using triple quadrupole inductively coupled plasma mass spectrometry (ICP-MS)

Applications
| 2024 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific
Industries
Energy & Chemicals , Semiconductor Analysis

Analysis of Electrolyte and Electrode in LIB Degraded by Overcharge and High Temperature

Applications
| 2026 | Shimadzu
GD/MP/ICP-AES, GC/MSD, X-ray, GC/SQ
Instrumentation
GD/MP/ICP-AES, GC/MSD, X-ray, GC/SQ
Manufacturer
Shimadzu
Industries
Semiconductor Analysis

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

Applications
| 2015 | Agilent Technologies
GC, Speciation analysis, ICP/MS/MS
Instrumentation
GC, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis

Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples

Technical notes
| 2010 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Determination of ultra trace elements in high purity hydrogen peroxide with Agilent 8900 ICP-QQQ

Applications
| 2016 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS

Applications
| 2003 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

WCPS: AGILENT 8800 TRIPLE QUADRUPOLE ICP-MS WINTER PLASMA CONFERENCE 2012 POSTERS

Posters
| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Semiconductor Analysis

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

Applications
| 2020 | Agilent Technologies
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Ultratrace Analysis of Solar (Photovoltaic) Grade Bulk Silicon by ICP-MS

Applications
| 2008 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
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