ICPMS
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike

Applications from the field of Semiconductor Analysis - page 5

Elemental and Particle Analysis of N-Methyl-2-Pyrrolidone (NMP) by ICP-MS/MS

Applications
| 2022 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Determination of Ultratrace Impurities in Semiconductor Photoresist Using ICP-MS/MS

Applications
| 2023 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Analysis of Ultratrace Impurities in High Silicon Matrix Samples by ICP-QQQ

Applications
| 2021 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Automated Analysis of Semiconductor Grade Hydrogen Peroxide and DI Water using ICP-QQQ

Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Analysis of Nanoparticles in Organic Reagents by Agilent 8900 ICP-QQQ in spICP-MS Mode

Applications
| 2019 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Agilent Atomic Spectroscopy Solutions for the Semiconductor Industry

Guides
| 2020 | Agilent Technologies
ICP/MS, ICP-OES, AAS, ICP/MS/MS, GD/MP/ICP-AES
Instrumentation
ICP/MS, ICP-OES, AAS, ICP/MS/MS, GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Determination of ultratrace elements on silicon wafer surfaces using the Thermo Scientific iCAP TQs ICP-MS

Applications
| 2018 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis

Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS

Applications
| 2017 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Characterization of Iron Nanoparticles in Hydrocarbon Matrices by Single Particle (sp)ICP-MS

Applications
| 2022 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis

Analysis of Ultratrace Impurities in High Purity Copper using the Agilent 8900 ICP-QQQ

Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Other projects
GCMS
LCMS
Follow us
FacebookLinkedInYouTube
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike