Applications from the field of Semiconductor Analysis - page 3

TOC and IC Measurements for Lithium Refining Processes

Applications

| 2025 | Shimadzu

TOC, Ion chromatography

Instrumentation

TOC, Ion chromatography

Manufacturer

Shimadzu

Industries

Semiconductor Analysis

Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

Applications

| 2003 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900

Guides

| 2022 | Agilent Technologies

GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, HPLC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies, Elemental Scientific

Industries

Environmental, Food & Agriculture, Energy & Chemicals , Pharma & Biopharma, Materials Testing, Semiconductor Analysis , Clinical Research

iCAP TQ ICP-MS Applications Compendium

Guides

| 2019 | Thermo Fisher Scientific

ICP/MS, ICP/MS/MS, Sample Preparation, Laser ablation

Instrumentation

ICP/MS, ICP/MS/MS, Sample Preparation, Laser ablation

Manufacturer

Thermo Fisher Scientific, Elemental Scientific

Industries

Pharma & Biopharma, Forensics , Clinical Research, Semiconductor Analysis , Food & Agriculture, Energy & Chemicals , Environmental, Materials Testing

Ultrapure Process Chemicals Analysis by ICP-QQQ with Hot Plasma Conditions

Applications

| 2021 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS

Applications

| 2017 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

Applications

| 2015 | Agilent Technologies

GC, Speciation analysis, ICP/MS/MS

Instrumentation

GC, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Semiconductor Analysis

Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

Applications

| 2001 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Analysis of Electrolyte and Electrode in LIB Degraded by Overcharge and High Temperature

Applications

| 2026 | Shimadzu

GD/MP/ICP-AES, GC/MSD, X-ray, GC/SQ

Instrumentation

GD/MP/ICP-AES, GC/MSD, X-ray, GC/SQ

Manufacturer

Shimadzu

Industries

Semiconductor Analysis

Analysis of Ultratrace Impurities in High Purity Copper using the Agilent 8900 ICP-QQQ

Applications

| 2018 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Semiconductor Analysis