Applications from the field of Semiconductor Analysis - page 3

Determination of trace elements in ultrapure semiconductor grade sulfuric acid using the Agilent 8900 ICP-QQQ in MS/MS mode

Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Instruments for Analyzing / Evaluating Electronic Device

Brochures and specifications
| 2022 | Shimadzu
GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC
Instrumentation
GC/MSD, HeadSpace, Thermal desorption, Pyrolysis, GC/SQ, Ion chromatography, NIR Spectroscopy, UV–VIS spectrophotometry, ICP/MS, ICP-OES, AAS, FTIR Spectroscopy, Microscopy, X-ray, TOC
Manufacturer
Shimadzu
Industries
Materials Testing, Semiconductor Analysis

iCAP TQ ICP-MS Applications Compendium

Guides
| 2019 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS, Sample Preparation, Laser ablation
Instrumentation
ICP/MS, ICP/MS/MS, Sample Preparation, Laser ablation
Manufacturer
Thermo Fisher Scientific, Elemental Scientific
Industries
Pharma & Biopharma, Forensics , Clinical Research, Semiconductor Analysis , Food & Agriculture, Energy & Chemicals , Environmental, Materials Testing

Determination of Trace Impurities in Electronic Grade Arsine by GC-ICP-QQQ

Applications
| 2020 | Agilent Technologies
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Improvement of ICP-MS detectability of phosphorus and titanium in high purity silicon samples using the Agilent 8800 Triple Quadrupole ICP-MS

Applications
| 2013 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Carbon and Oxygen Quantification in Silicon wafers

Applications
| 2021 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Semiconductor Analysis

Cross-Sectional Analysis of Power Semiconductor and Silver Sintering Die Attach Material

Applications
| 2025 | Shimadzu
Microscopy
Instrumentation
Microscopy
Manufacturer
Shimadzu
Industries
Semiconductor Analysis

Quality control of semiconductor acid baths as per ASTM E1655 – Time- and cost-efficient with NIRS

Technical notes
| 2021 | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
Semiconductor Analysis

Analysis of Nanoparticles in Organic Reagents by Agilent 8900 ICP-QQQ in spICP-MS Mode

Applications
| 2019 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Ultra-low level determination of phosphorus, sulfur, silicon and chlorine using the Agilent 8900 ICP-QQQ

Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
Follow us
FacebookLinkedInYouTube
More information
WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike