Applications from the field of Semiconductor Analysis - page 2

Determination of ultratrace elements in semiconductor grade nitric acid using the Thermo Scientific iCAP TQs ICP-MS

Applications

| 2018 | Thermo Fisher Scientific

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS

Applications

| 2017 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

C-Flow Nebulizer - Operating Instructions

Manuals

| 2020 | Savillex

Consumables, ICP/MS, ICP-OES, GD/MP/ICP-AES

Instrumentation

Consumables, ICP/MS, ICP-OES, GD/MP/ICP-AES

Manufacturer

Savillex

Industries

Semiconductor Analysis

Thermo Scientific ICP-MS solutions for the semiconductor industry

Brochures and specifications

| 2018 | Thermo Fisher Scientific

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

Characterization of Trace Impurities in Silicon Wafers by High Sensitivity Reaction Cell ICP-MS

Applications

| 2003 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Agilent ICP-MS Journal (July 2017 – Issue 69)

Others

| 2017 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Environmental, Pharma & Biopharma, Semiconductor Analysis

Determination of Trace Metal Impurities in Semiconductor Grade Phosphoric Acid by High Sensitivity Reaction Cell ICP-MS

Applications

| 2003 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Agilent Atomic Spectroscopy Solutions for the Semiconductor Industry

Guides

| 2020 | Agilent Technologies

ICP/MS, ICP-OES, AAS, ICP/MS/MS, GD/MP/ICP-AES

Instrumentation

ICP/MS, ICP-OES, AAS, ICP/MS/MS, GD/MP/ICP-AES

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Agilent ICP-MS Journal (December 2016 – Issue 67)

Others

| 2016 | Agilent Technologies

ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Environmental, Semiconductor Analysis

Direct Analysis of Metallic Impurities in SiC and GaN Wafers by LA-GED-MSAG-ICP-MS/MS

Applications

| 2023 | Agilent Technologies

ICP/MS, ICP/MS/MS, Laser ablation

Instrumentation

ICP/MS, ICP/MS/MS, Laser ablation

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis