Applications from the field of Semiconductor Analysis - page 2

Multi-Elemental Analysis of Lithium Aluminum Titanium Phosphate by Automated ICP-OES

Applications

| 2025 | Agilent Technologies

ICP-OES

Instrumentation

ICP-OES

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis , Energy & Chemicals

WCPS: The Analysis and Stability of High Purity TetraMethylAm m onium Hyrdoxide (TMAH) with the Agilent 8900 QQQ-ICPMS

Posters

| 2018 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Ultra trace measurement of potassium and other elements in ultrapure water using the Agilent 8800 ICP-QQQ in cool plasma reaction cell mode

Applications

| 2014 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Analysis of Ultratrace Impurities in High Purity Copper using the Agilent 8900 ICP-QQQ

Applications

| 2018 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Semiconductor Analysis

Quantitative analysis of high purity metals using laser ablation coupled to an Agilent 7900 ICP-MS

Applications

| 2015 | Agilent Technologies

ICP/MS, Laser ablation

Instrumentation

ICP/MS, Laser ablation

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Semiconductor Analysis

Analysis of Metallic Impurities in Specialty Semiconductor Gases Using Gas Exchange Device (GED)-ICP-MS

Applications

| 2022 | Agilent Technologies

ICP/MS, ICP/MS/MS

Instrumentation

ICP/MS, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Direct Measurement of Metallic Impurities in 20% Ammonium Hydroxide by 7700s/7900 ICP-MS

Applications

| 2017 | Agilent Technologies

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis

Sub-ppb detection limits for hydride gas contaminants using GC-ICP-QQQ

Applications

| 2015 | Agilent Technologies

GC, Speciation analysis, ICP/MS/MS

Instrumentation

GC, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Energy & Chemicals , Semiconductor Analysis

Accurate analysis of major components and trace level impurities in cathode active materials used in lithium ion battery production

Applications

| 2025 | Thermo Fisher Scientific

ICP/MS

Instrumentation

ICP/MS

Manufacturer

Thermo Fisher Scientific

Industries

Semiconductor Analysis

Measuring Inorganic Impurities in Semiconductor Manufacturing

Guides

| 2022 | Agilent Technologies

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Instrumentation

GC, ICP/MS, Speciation analysis, ICP/MS/MS

Manufacturer

Agilent Technologies

Industries

Semiconductor Analysis