Menu
News
News
Events
Academy - Coming soon
Library
ICPMS Library
GCMS Library
LCMS Library
Webinars
Webinars
Products
Instruments and services
Marketplace
Companies
Commercial
Non-Commercial
Medial
Career
Job offers
More information
Webinars
About us
Contact us
Terms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike
News
Library
Webinars
Products
Companies
Career
News
Events
Academy - Coming soon
ICPMS Library
GCMS Library
LCMS Library
Webinars
Instruments and services
Marketplace
Commercial
Non-Commercial
Medial
Job offers
Databases
ICPMS_EN
GCMS_EN
LCMS_EN
Industries
Clinical Research
(2)
Energy & Chemicals
(8)
Environmental
(4)
Food & Agriculture
(3)
Semiconductor Analysis
Semiconductor Analysis
Instrumentation
Consumables
(1)
AAS
(2)
Elemental Analysis
(1)
FTIR Spectroscopy
(3)
Manufacturer
Agilent Technologies
(36)
Bruker
(2)
Elemental Scientific
(3)
Savillex
(1)
Author
Agilent Technologies
(36)
Bruker Optics
(2)
Savillex
(1)
Shimadzu
(7)
Content Type
Applications
(40)
Brochures and specifications
(2)
Guides
(5)
Manuals
(1)
Publication Date
Applications from the field of Semiconductor Analysis - page 2
Measuring the optical properties of photovoltaic cells using the Agilent Cary 5000 UV-Vis-NIR spectrophotometer and the External DRA-2500
Applications
| 2011 | Agilent Technologies
NIR Spectroscopy, UV–VIS spectrophotometry
Instrumentation
NIR Spectroscopy, UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis
Agilent ICP-MS Journal (April 2018. Issue 72)
Others
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture, Semiconductor Analysis
Determination of ultratrace elements in photoresist solvents using the Thermo Scientific iCAP TQs ICP-MS
Applications
| 2018 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific, Elemental Scientific, Teledyne LABS
Industries
Semiconductor Analysis
TOC and IC Measurements for Lithium Refining Processes
Applications
| 2025 | Shimadzu
TOC, Ion chromatography
Instrumentation
TOC, Ion chromatography
Manufacturer
Shimadzu
Industries
Semiconductor Analysis
Trace Elemental Analysis of Trichlorosilane by Agilent ICP-MS
Applications
| 2021 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Analysis of Electroceramics by Laser Ablation ICP-MS
Applications
| 2004 | Agilent Technologies
ICP/MS, Laser ablation
Instrumentation
ICP/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Analysis of Electrolyte and Electrode in LIB Degraded by Overcharge and High Temperature
Applications
| 2026 | Shimadzu
GD/MP/ICP-AES, GC/MSD, X-ray, GC/SQ
Instrumentation
GD/MP/ICP-AES, GC/MSD, X-ray, GC/SQ
Manufacturer
Shimadzu
Industries
Semiconductor Analysis
Analysis of Trace Metal Impurities in High Purity Hydrochloric Acid Using ICP-QQQ
Applications
| 2017 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Evaluation of Organic Impurities in Lithium Carbonate by TOC Analysis
Applications
| 2026 | Shimadzu
TOC
Instrumentation
TOC
Manufacturer
Shimadzu
Industries
Semiconductor Analysis
Analysis of silicon, phosphorus and sulfur in 20% methanol using the Agilent 8800 Triple Quadrupole ICP-MS
Applications
| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
Prev
1
2
3
...
Next
Other projects
Follow us
More information
Webinars
About us
Contact us
Terms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike