Applications from the field of Semiconductor Analysis - page 2

The deep ultraviolet spectroscopic properties of a next-generation photoresist

Applications
| 2011 | Agilent Technologies
UV–VIS spectrophotometry
Instrumentation
UV–VIS spectrophotometry
Manufacturer
Agilent Technologies
Industries
Materials Testing, Semiconductor Analysis

Analysis of a CMOS Chip Circuit Board using the stand-alone FTIR Microscope LUMOS II

Applications
| 2021 | Bruker Optics
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Bruker
Industries
Semiconductor Analysis

Agilent ICP-MS Journal (December 2016 – Issue 67)

Others
| 2016 | Agilent Technologies
ICP/MS, Speciation analysis, ICP/MS/MS
Instrumentation
ICP/MS, Speciation analysis, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Semiconductor Analysis

Agilent ICP-MS Journal (April 2020, Issue 80)

Others
| 2020 | Agilent Technologies
Software, ICP/MS, ICP/MS/MS
Instrumentation
Software, ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Ultra-low level determination of phosphorus, sulfur, silicon and chlorine using the Agilent 8900 ICP-QQQ

Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

Lowering the Cost of Fluoropolymer Components in Semiconductor Manufacturing

Technical notes
| 2021 | Savillex
Consumables
Instrumentation
Consumables
Manufacturer
Savillex
Industries
Semiconductor Analysis

Agilent Atomic Spectroscopy Solutions for the Semiconductor Industry

Guides
| 2020 | Agilent Technologies
ICP/MS, ICP-OES, AAS, ICP/MS/MS, GD/MP/ICP-AES
Instrumentation
ICP/MS, ICP-OES, AAS, ICP/MS/MS, GD/MP/ICP-AES
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis

WCPS: AGILENT 8800 TRIPLE QUADRUPOLE ICP-MS WINTER PLASMA CONFERENCE 2012 POSTERS

Posters
| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Environmental, Semiconductor Analysis

Determination of ultratrace elements on silicon wafer surfaces using the Thermo Scientific iCAP TQs ICP-MS

Applications
| 2018 | Thermo Fisher Scientific
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Thermo Fisher Scientific
Industries
Semiconductor Analysis

Basic Performance of the Agilent 7700s ICP-MS for the Analysis of Semiconductor Samples

Technical notes
| 2010 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Other projects
GCMS
LCMS
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