APWC: Application of single particle ICP-MS for silver nanoparticles characterization

Posters | 2017 | Agilent TechnologiesInstrumentation
ICP/MS
Industries
Energy & Chemicals
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Agilent Technologies
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Applications of ICP-MSMeasuring Inorganic Impuritiesin Semiconductor ManufacturingApplication Compendium > Return to table of contents> Search entire documentTable of contentsICP-MS and ICP-QQQ in the Semiconductor Industry4Agilent Has Three Decades of ICP-MS Experience DrivingContinuous Innovation7Agilent ICP-MS Solutions for the Semiconductor Industry8Automating Analysis of...
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Application NoteSemiconductorAnalysis of Nanoparticles in OrganicReagents by Agilent 8900 ICP-QQQin spICP-MS ModeDetermination of 25 and 30 nm Fe3O4 NPsin low-particle concentration solutionsAuthorDonna Hsu, YoshinoriShimamura, Brian Liao,and Michiko Yamanaka1Chun-Hua Chen andChiu-Hun Su2Ching Heng Hsu31Agilent Technologies, Inc.Industrial Technology ResearchInstitute of Taiwan, Taiwan23BASF...
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Evaluating the dispersion of TiO2nanoparticles via sp-ICP-MS for sunscreenpowder analysisChia-Chin (Donna) Hsu1*, Chun-HuaChen2, Meng-Tzu Lai2, Yen-Ying (Brian)Laio1, Ching-Heng (Jones) Hsu3, ChiuHun Su2*2017APWC1. Agilent Technologies Co. LtdC-042. Industrial Technology Research Institute3. BASFResults and DiscussionCommercial Sunscreen powder Sample: Directly dilution-2Compared with the...
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Application NoteSemiconductorAnalysis of 50 nm Silica Nanoparticlesin Semiconductor Process Chemicalsby spICP-MS/MSAccurate detection of insoluble SiO2 NPs in highpurity acids and solvents by Agilent 8900 ICP-QQQAuthorsIntroductionDonna Hsu, Brian Liao, KatsuoMizobuchi, Michiko Yamanaka,Agilent Technologies, Inc.The fabrication of smaller, denser, more power-efficient integrated...
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