APWC: Application of single particle ICP-MS for silver nanoparticles characterization
Posters | 2017 | Agilent Technologies Instrumentation
ICP/MS
IndustriesEnergy & Chemicals
ManufacturerAgilent Technologies
Key wordsagnps, size, mean, spicp, stability, particle, disintegration, testing, water, rsd, particles, rain, single, suspensions, nanomaterials, effects, nps, nanoparticle, test, nanoparticles, artificial, silver, diluting, tap, principle, ultrapure, concentration, industrial, stock, term, icp, nebulizer, short, repeatability, waste, dilution, characterization, chemicals, made, comparison, waters, workflow, increase, instrumentation, environmental, abstract, reference, matrix, acid, experimental
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Applications of ICP-MSMeasuring Inorganic Impuritiesin Semiconductor ManufacturingApplication Compendium > Return to table of contents> Search entire documentTable of contentsICP-MS and ICP-QQQ in the Semiconductor Industry4Agilent Has Three Decades of ICP-MS Experience DrivingContinuous Innovation7Agilent ICP-MS Solutions for the Semiconductor Industry8Automating Analysis of...
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Analysis of Nanoparticles in Organic Reagents by Agilent 8900 ICP-QQQ in spICP-MS Mode
2019|Agilent Technologies|Applications
Application NoteSemiconductorAnalysis of Nanoparticles in OrganicReagents by Agilent 8900 ICP-QQQin spICP-MS ModeDetermination of 25 and 30 nm Fe3O4 NPsin low-particle concentration solutionsAuthorDonna Hsu, YoshinoriShimamura, Brian Liao,and Michiko Yamanaka1Chun-Hua Chen andChiu-Hun Su2Ching Heng Hsu31Agilent Technologies, Inc.Industrial Technology ResearchInstitute of Taiwan, Taiwan23BASF...
Key words
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Multielement Nanoparticle Analysis of Semiconductor Process Chemicals Using spICP-QQQ
2019|Agilent Technologies|Applications
Application NoteSemiconductorMultielement Nanoparticle Analysisof Semiconductor Process ChemicalsUsing spICP-QQQCharacterization of Ag, Fe3O4, Al2O3, Au, andSiO2 NPs in TMAH in a single analytical runAuthorYoshinori Shimamura,Donna Hsu, andMichiko YamanakaAgilent Technologies, Inc.IntroductionTechnologies such as smartphones, cloud computing, the Internet of Things(IoT), and development of...
Key words
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APWC: Evaluating the dispersion of TiO2 nanoparticles via sp-ICP-MS for sunscreen powder analysis
2017|Agilent Technologies|Posters
Evaluating the dispersion of TiO2nanoparticles via sp-ICP-MS for sunscreenpowder analysisChia-Chin (Donna) Hsu1*, Chun-HuaChen2, Meng-Tzu Lai2, Yen-Ying (Brian)Laio1, Ching-Heng (Jones) Hsu3, ChiuHun Su2*2017APWC1. Agilent Technologies Co. LtdC-042. Industrial Technology Research Institute3. BASFResults and DiscussionCommercial Sunscreen powder Sample: Directly dilution-2Compared with the...
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