Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ
Applications | 2016 | Agilent TechnologiesInstrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
IndustriesEnergy & Chemicals , Semiconductor Analysis
ManufacturerAgilent Technologies
Key wordscarbonyls, nickel, icp, qqq, iron, gas, metal, monoxide, tune, carbonyl, loop, standard, carbon, detection, mode, nebulizer, aqueous, aspiration, helium, carrier, acquisition, using, effluent, used, conditions, approach, anguiano, jesus, cell, twofold, optimum, can, etch, chromatographic, hydrogen, lead, mass, mixed, switching, elegant, were, since, dilution, calibration, wafers, errors, second, deposit, via, blank
Similar PDF
Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900
2022|Agilent Technologies|Guides
5th EditionHandbook of ICP-QQQApplications using theAgilent 8800 and 8900Primer> Return to table of contents> Search entire documentForewordAgilent Technologies launched its 8800 Triple QuadrupoleICP-MS (ICP-QQQ) at the 2012 Winter Conference on PlasmaSpectrochemistry in Tucson, Arizona, USA.By the time the first ICP-QQQ...
Key words
return, returncontents, contentstable, tableicp, icpqqq, qqqcps, cpsgas, gasmass, masscell, celldocument, documentppt, pptconc, concentire, entiresearch, searchelements
Elemental and Particle Analysis of N-Methyl-2-Pyrrolidone (NMP) by ICP-MS/MS
2022|Agilent Technologies|Applications
Application NoteSemiconductorElemental and Particle Analysis ofN-Methyl-2-Pyrrolidone (NMP) byICP-MS/MSAnalysis of dissolved and particulate inorganicimpurities in two grades of NMP using the Agilent8900 ICP-QQQAuthorIntroductionYoshinori ShimamuraIdeally, analytical quality control (QC) testing procedures should keep pace with thetechnologies they support. This has long been...
Key words
nmp, nmpppt, pptgrade, gradeicp, icpparticle, particlenanoparticle, nanoparticleconc, concsemiconductor, semiconductorgrades, gradeselements, elementsimpurities, impuritiesfabs, fabsgas, gasnps, npsindustry
Measuring Inorganic Impurities in Semiconductor Manufacturing
2022|Agilent Technologies|Guides
Applications of ICP-MSMeasuring Inorganic Impuritiesin Semiconductor ManufacturingApplication Compendium> Return to table of contents> Search entire documentTable of contentsICP-MS and ICP-QQQ in the Semiconductor Industry4Agilent Has Three Decades of ICP-MS Experience DrivingContinuous Innovation7Agilent ICP-MS Solutions for the Semiconductor Industry8Automating Analysis of...
Key words
return, returncontents, contentsicp, icptable, tablecps, cpsppt, pptgas, gassemiconductor, semiconductorconc, concqqq, qqqbec, becdocument, documententire, entiresearch, searchmode
Agilent ICP-MS Journal (April 2018. Issue 72)
2018|Agilent Technologies|Others
Agilent ICP-MS JournalApril 2018. Issue 72Page 1How SemiconductorIndustry Requirements DriveInnovation in Agilent’s ICP-MSPage 2-3ICP-MS and ICP-QQQ in theSemiconductor IndustryPage 4-5How Semiconductor IndustryRequirements Drive Innovationin Agilent‘s ICP-MSEd McCurdy, ICP-MS Product Marketing, Agilent UKIn this issue of the ICP-MS Journal, we take...
Key words
icp, icpsemiconductor, semiconductorwafer, waferfabrication, fabricationjournal, journalagilent, agilentpurity, puritymetal, metalindustry, industryresist, resistqqq, qqqcigarettes, cigarettesmetals, metalshigh, highamelia