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Gas chromatographic separation of metal carbonyls in carbon monoxide with detection using the Agilent 8800 ICP-QQQ

Applications | 2016 | Agilent TechnologiesInstrumentation
GC, ICP/MS, Speciation analysis, ICP/MS/MS
Industries
Energy & Chemicals , Semiconductor Analysis
Manufacturer
Agilent Technologies
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Measuring Inorganic Impurities in Semiconductor Manufacturing
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Handbook of ICP-QQQ Applications using the Agilent 8800 and 8900
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Agilent ICP-MS Journal (April 2018. Issue 72)
Agilent ICP-MS Journal (April 2018. Issue 72)
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Agilent ICP-MS Journal April 2018. Issue 72 Page 1 How Semiconductor Industry Requirements Drive Innovation in Agilent’s ICP-MS Page 2-3 ICP-MS and ICP-QQQ in the Semiconductor Industry Page 4-5 How Semiconductor Industry Requirements Drive Innovation in Agilent‘s ICP-MS Ed McCurdy,…
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Elemental and Particle Analysis of N-Methyl-2-Pyrrolidone (NMP) by ICP-MS/MS
Application Note Semiconductor Elemental and Particle Analysis of N-Methyl-2-Pyrrolidone (NMP) by ICP-MS/MS Analysis of dissolved and particulate inorganic impurities in two grades of NMP using the Agilent 8900 ICP-QQQ Author Introduction Yoshinori Shimamura Ideally, analytical quality control (QC) testing procedures…
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