Ultra-fast ICP-OES determinations of base metals in geochemical samples using next generation sample introduction technology
Applications | 2012 | Agilent TechnologiesInstrumentation
ICP/OES
IndustriesEnvironmental
ManufacturerAgilent Technologies
Key wordsgeochemical, icp, iec, certified, oneneb, uptake, element, expert, pump, wavelength, unpredictable, metals, sample, speed, agilent, lod, calibration, interferences, nebulizer, base, polychromators, triplicate, spectral, geostats, oes, time, measured, high, cauduro, recovery, inject, analysis, introduction, range, replicate, condition, delay, loop, flow, solutions, feature, next, samples, generation, were, grade, setting, analyzing, refill, system
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