Sanofi-aventis - A high throughput assay for oxaliplatin in clinical samples
Ostatní | 2007 | Agilent TechnologiesInstrumentation
ICP/MS
IndustriesFarmaceutická analýza
ManufacturerAgilent Technologies
Key wordsoxaliplatin, aventis, icp, sanofi, platinum, puf, plasma, pharmacokinetics, throughput, pump, department, replacement, assay, oncology, old, metabolism, sample, dynamic, analysis, tolerance, matrix, support, global, rotary, turbo, matrices, eloxatin, oxaliplatinderived, platinumcontaining, quardrupole, measure, range, preparation, would, project, carboplatin, combinational, equipment, cone, assays, nominal, been, ultrafiltrate, instrument, payback, cisplatin, lens, clinical, peri, leading
Similar PDF
Agilent ICP-MS Journal (January 2008 – Issue 33)
2008|Agilent Technologies|Ostatní
Agilent ICP-MS Journal January 2008 – Issue 33 Inside this Issue 2-3 GC-ICP-MS for Volatile Siloxane Compounds of Importance to the Wastewater Industry 4-5 Rinse Solution for Boron Analysis and Boron Isotope Ratios 6 How to Download ICP-MS ChemStation Software…
Key words
boron, boronicp, icpagilent, agilentsiloxanes, siloxanesrinse, rinsebiogas, biogastorch, torchchemstation, chemstationnebulizers, nebulizersmemory, memoryforum, forumvolatile, volatiledodecamethylpentasiloxane, dodecamethylpentasiloxaneisotope, isotopestand
Agilent ICP-MS Journal (August 2006 – Issue 28)
2006|Agilent Technologies|Ostatní
Agilent ICP-MS Journal August 2006 – Issue 28 Inside this Issue 2 User Article: Direct Analysis of Gaseous Samples by ICP-MS, Sumitomo Seika Chemicals Ltd., Japan 3 Success Story: Nestle Waters: Certification of 7500ce Method for Trace Elements in Water…
Key words
icp, icpchemstation, chemstationnew, newcrc, crcnestlé, nestléagilent, agilentelements, elementsdrinking, drinkingwater, waterparticulates, particulatescell, cellurine, urinefeature, featureupgrade, upgradegas
Measuring Inorganic Impurities in Semiconductor Manufacturing
2022|Agilent Technologies|Guides
Applications of ICP-MS Measuring Inorganic Impurities in Semiconductor Manufacturing Application Compendium > Return to table of contents > Search entire document Table of contents ICP-MS and ICP-QQQ in the Semiconductor Industry 4 Agilent Has Three Decades of ICP-MS Experience Driving…
Key words
return, returncontents, contentsicp, icptable, tablecps, cpsppt, pptgas, gassemiconductor, semiconductorconc, concqqq, qqqbec, becdocument, documententire, entiresearch, searchmode
Agilent ICP-MS Journal (March 2006 – Issue 26)
2006|Agilent Technologies|Ostatní
Agilent ICP-MS Journal March 2006 – Issue 26 !S W E N C P- M Agilent I ased video reler details! see page 8 fo Inside this Issue 2/3 User article: An Application of ICP-MS in Chemical Metrology 4/5 User…
Key words
icp, icpskimmer, skimmerstd, stdagilent, agilentcone, conemetrology, metrologyccqm, ccqmnmis, nmislgc, lgcidms, idmsmeasurements, measurementscones, conesselenomethionine, selenomethioninebase, basebipm
