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    Carbon Measurement of Oil Shale

    Applications
    | 2018 | Shimadzu
    TOC
    Instrumentation
    TOC
    Manufacturer
    Shimadzu
    Industries
    Environmental

    Quality Evaluation of Medical Devices Using TOC Solid Sample Measurement System

    Applications
    | 2018 | Shimadzu
    TOC
    Instrumentation
    TOC
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Free your ICP-MS Workflow From Common Time Traps

    Others
    | 2020 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries

    WCPS: Efficient Removal of Polyatomic Ions by ICP-MS Equipped with Novel Reaction Cell: Examples of Highly Purified Chemicals Used for Semiconductor

    Posters
    | 2012 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Introducing the EDXIR-Holder: Sample Holder/Stocker for Contaminant Measurement

    Technical notes
    | 2017 | Shimadzu
    FTIR Spectroscopy, X-ray
    Instrumentation
    FTIR Spectroscopy, X-ray
    Manufacturer
    Shimadzu
    Industries

    Determination of trace amounts of Mercury (II) by Total Fluorescence Quenching using 1,10-phenanthroline and eosin

    Applications
    | 2012 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Environmental

    Method Package Guidebook

    Guides
    | 2022 | Shimadzu
    GC/MSD, GC/MS/MS, Pyrolysis, GC/SQ, GC/QQQ, Software, LC/MS, LC/MS/MS, LC/QQQ, NIR Spectroscopy
    Instrumentation
    GC/MSD, GC/MS/MS, Pyrolysis, GC/SQ, GC/QQQ, Software, LC/MS, LC/MS/MS, LC/QQQ, NIR Spectroscopy
    Manufacturer
    Shimadzu
    Industries
    Environmental, Food & Agriculture, Forensics , Energy & Chemicals , Proteomics , Metabolomics, Lipidomics

    Characterization of Surface Metal Contamination on Silicon Wafers Using Surface Metal Extraction Inductively Coupled Plasma Mass Spectrometry (SME- ICP-MS)

    Applications
    | 2001 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis

    Analysis of High Solids Solutions by Flame Atomic Absorption

    Technical notes
    | 2010 | Agilent Technologies
    AAS
    Instrumentation
    AAS
    Manufacturer
    Agilent Technologies
    Industries

    Agilent ICP-MS Journal (April 2020, Issue 80)

    Others
    | 2020 | Agilent Technologies
    Software, ICP/MS, ICP/MS/MS
    Instrumentation
    Software, ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Semiconductor Analysis
     

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