Library | LabRulez ICPMS

Evaluation of Amyloid-β Aggregation by RF-6000 Spectrofluorophotometer

Applications

| 2020 | Shimadzu

Fluorescence spectroscopy

Instrumentation

Fluorescence spectroscopy

Manufacturer

Shimadzu

Industries

Clinical Research

EDXRF Analysis of Polymer Film

Applications

| N/A | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

WCPS: Fundamental Studies of a Nitrogen Microwave Plasma for Analytical Emission Spectroscopy

Posters

| 2017 | Agilent Technologies

MP/ICP-AES

Instrumentation

MP/ICP-AES

Manufacturer

Agilent Technologies

Industries

Surface Enhanced Raman Scattering (SERS) – Expanding the Limits of Conventional Raman Analysis

Technical notes

| 2018 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Introduction to Raman Spectroscopy

Guides

| 2015 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Agilent Cary Universal Measurement Accessory (UMA)

Technical notes

| 2013 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Agilent Cary 7000 universal measurement spectrophotometer

Brochures and specifications

| 2022 | Agilent Technologies

NIR Spectroscopy, UV–VIS spectrophotometry

Instrumentation

NIR Spectroscopy, UV–VIS spectrophotometry

Manufacturer

Agilent Technologies

Industries

Rapid Identification of Polysorbates 20 and 80 Directly Through Amber Bottles

Applications

| 2021 | Agilent Technologies

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Agilent Technologies

Industries

Pharma & Biopharma

STRaman Technology: Raman for See Through Material Identification

Technical notes

| 2017 | Metrohm

RAMAN Spectroscopy

Instrumentation

RAMAN Spectroscopy

Manufacturer

Metrohm

Industries

Materials Testing

X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)

Applications

| N/A | Shimadzu

X-ray

Instrumentation

X-ray

Manufacturer

Shimadzu

Industries

Materials Testing

Evaluation of Amyloid-β Aggregation by RF-6000 Spectrofluorophotometer

EDXRF Analysis of Polymer Film

WCPS: Fundamental Studies of a Nitrogen Microwave Plasma for Analytical Emission Spectroscopy

Surface Enhanced Raman Scattering (SERS) – Expanding the Limits of Conventional Raman Analysis

Introduction to Raman Spectroscopy

Agilent Cary Universal Measurement Accessory (UMA)

Agilent Cary 7000 universal measurement spectrophotometer

Rapid Identification of Polysorbates 20 and 80 Directly Through Amber Bottles

STRaman Technology: Raman for See Through Material Identification

X-ray Fluorescence Analysis of Lead in Tin Plating Using Theoretical Intensity of Scattered X-rays - Analysis of RoHS Regulated Elements by Energy Dispersive X-ray Fluorescence Spectrometer (EDX)

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