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    Low reflectance measurements using the ‘VW’ technique

    Technical notes
    | 2011 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries

    The Effect of Temperature and Pressure on GC Flow Measurements

    Technical notes
    | 1997 | Merck
    GC
    Instrumentation
    GC
    Manufacturer
    Merck
    Industries

    NCI Method Indispensable for GC/MS Measurements of Pesticides

    Applications
    | N/A | Shimadzu
    GC/MSD, GC/SQ
    Instrumentation
    GC/MSD, GC/SQ
    Manufacturer
    Shimadzu
    Industries
    Environmental, Food & Agriculture

    Unattended, Automated Measurements of Optical Components in a Production Environment

    Technical notes
    | 2018 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Security Measures for Protecting the Reliability of Measurement Data

    Technical notes
    | 2012 | Shimadzu
    GC, Software, HPLC
    Instrumentation
    GC, Software, HPLC
    Manufacturer
    Shimadzu
    Industries

    Sampling Guidelines for Handheld Raman Measurements; What You Need To Know

    Technical notes
    | 2019 | Metrohm
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Metrohm
    Industries

    Increase the accuracy of your NIR measurements with instrument calibration

    Technical notes
    | N/A | Metrohm
    NIR Spectroscopy
    Instrumentation
    NIR Spectroscopy
    Manufacturer
    Metrohm
    Industries

    Increase the accuracy of your NIR measurements with reference standardization

    Technical notes
    | N/A | Metrohm
    NIR Spectroscopy
    Instrumentation
    NIR Spectroscopy
    Manufacturer
    Metrohm
    Industries

    Digital Signal Processing in Polarization Modulation - Infrared Reflection Absorption Measurements

    Technical notes
    | N/A | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries

    Coated Wafer Mapping Using UV-Vis Spectral Reflection and Transmission Measurements

    Applications
    | 2020 | Agilent Technologies
    NIR Spectroscopy, UV–VIS spectrophotometry
    Instrumentation
    NIR Spectroscopy, UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis
     

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