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Real-time Spectral Correction of Complex Samples using FACT Spectral Deconvolution Software
Technical notes
| 2021 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
FACT spectral deconvolution
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Fitted Background Correction (FBC) — fast, accurate and fully-automated background correction
Technical notes
| 2019 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
Analysis of Lithium Ores Using Handheld Direct Diffuse Reflectance FTIR Spectroscopy
Applications
| 2024 | Agilent Technologies
FTIR Spectroscopy
Instrumentation
FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Environmental
‘Fitted’ — Fast, accurate and fully- automated background correction
Technical notes
| 2012 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
MicroLab Expert Software
Others
| 2016 | Agilent Technologies
Software, FTIR Spectroscopy
Instrumentation
Software, FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
Fluorescence-free 785 nm material identification with MIRA XTR DS
Technical notes
| 2021 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Homeland Security
Fitted Background Correction (FBC)— fast, accurate and fully-automated background correction
Technical notes
| 2014 | Agilent Technologies
ICP-OES
Instrumentation
ICP-OES
Manufacturer
Agilent Technologies
Industries
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WebinarsAbout usContact usTerms of use
LabRulez s.r.o. All rights reserved. Content available under a CC BY-SA 4.0 Attribution-ShareAlike