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Publication Date
Real-time Spectral Correction of Complex Samples using FACT Spectral Deconvolution Software
Technical notes
| 2021 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
FACT spectral deconvolution
Technical notes
| 2012 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Fitted Background Correction (FBC) — fast, accurate and fully-automated background correction
Technical notes
| 2019 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
MicroLab Expert Software
Others
| 2016 | Agilent Technologies
Software, FTIR Spectroscopy
Instrumentation
Software, FTIR Spectroscopy
Manufacturer
Agilent Technologies
Industries
‘Fitted’ — Fast, accurate and fully- automated background correction
Technical notes
| 2012 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
Fluorescence-free 785 nm material identification with MIRA XTR DS
Technical notes
| 2021 | Metrohm
RAMAN Spectroscopy
Instrumentation
RAMAN Spectroscopy
Manufacturer
Metrohm
Industries
Homeland Security
Fitted Background Correction (FBC)— fast, accurate and fully-automated background correction
Technical notes
| 2014 | Agilent Technologies
ICP/OES
Instrumentation
ICP/OES
Manufacturer
Agilent Technologies
Industries
KnowItAll Software Training - Data Mining & Analysis
Manuals
| 2023 | Wiley
Software
Instrumentation
Software
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Wiley
Industries
Near-Infrared Spectroscopy: Quantitative analysis according to ASTM E1655
Technical notes
| 2018 | Metrohm
NIR Spectroscopy
Instrumentation
NIR Spectroscopy
Manufacturer
Metrohm
Industries
Energy & Chemicals
Rapid Analysis of High-Matrix Environmental Samples Using the Agilent 7500cx ICP-MS
Technical notes
| 2007 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Environmental
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