1. Databases

    1. Industries

    1. Instrumentation

    1. Manufacturer

    1. Author

    1. Content Type

    1. Publication Date

    Lead in lead-free solder – EDX-720

    Others
    | 2006 | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    EDXRF Analysis of Lead in Lead-Free Solder Materials

    Applications
    | N/A | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    Free your ICP-MS Workflow From Common Time Traps

    Others
    | 2020 | Agilent Technologies
    ICP/MS
    Instrumentation
    ICP/MS
    Manufacturer
    Agilent Technologies
    Industries

    Fluorescence-free 785 nm material identification with MIRA XTR DS

    Technical notes
    | 2021 | Metrohm
    RAMAN Spectroscopy
    Instrumentation
    RAMAN Spectroscopy
    Manufacturer
    Metrohm
    Industries
    Homeland Security

    Measurement of Lead in Lead-Free Solder by ICP-AES, FAAS and EDX

    Applications
    | 2012 | Shimadzu
    AAS, MP/ICP-AES, X-ray
    Instrumentation
    AAS, MP/ICP-AES, X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    EDXRF Analysis of Lead, Cadmium, Silver, Copper in Lead-Free Solder Materials

    Applications
    | N/A | Shimadzu
    X-ray
    Instrumentation
    X-ray
    Manufacturer
    Shimadzu
    Industries
    Materials Testing

    A new approach to sample preparation free micro ATR FTIR chemical imaging of polymer laminates

    Applications
    | 2011 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing

    Damage-free failure/defect analysis in electronics and semiconductor industries using micro-ATR FTIR imaging

    Applications
    | 2014 | Agilent Technologies
    FTIR Spectroscopy
    Instrumentation
    FTIR Spectroscopy
    Manufacturer
    Agilent Technologies
    Industries
    Materials Testing, Semiconductor Analysis

    APWC: Interference-free Measurement of Trace Mercury in Tungsten-rich Cosmetic Sample using ICP-QQQ

    Posters
    | 2017 | Agilent Technologies
    ICP/MS, ICP/MS/MS
    Instrumentation
    ICP/MS, ICP/MS/MS
    Manufacturer
    Agilent Technologies
    Industries
    Others

    Determination of antioxidant capacity in human serum using the Agilent Cary Eclipse for the ORAC assay

    Applications
    | 2014 | Agilent Technologies
    UV–VIS spectrophotometry
    Instrumentation
    UV–VIS spectrophotometry
    Manufacturer
    Agilent Technologies
    Industries
    Clinical Research
     

    Related content


    Surface-mounted regular arrays of fullerene-based molecular rotors

    Th, 28.3.2024
    Ústav organické chemie a biochemie AV ČR

    Science is made by people and people are driven by passion. However, passion alone is not enough, says Vinicius Santana

    Th, 28.3.2024
    CEITEC

    Webinars LabRulezICPMS Week 13/2024

    Su, 24.3.2024
    LabRulez
    Other projects
    Follow us
    More information
    WebinarsAbout usContact usTerms of use
    LabRulez s.r.o., all rights reserved.