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EDXRF Analysis of Cd and Pb
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| N/A | Shimadzu
X-ray
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X-ray
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Shimadzu
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Materials Testing
Why Calibration Graphs Curve in Atomic Absorption Spectrometry
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| 2010 | Agilent Technologies
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Agilent Technologies
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Fitted Background Correction (FBC) — fast, accurate and fully-automated background correction
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| 2019 | Agilent Technologies
ICP/OES
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Agilent Technologies
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‘Fitted’ — Fast, accurate and fully- automated background correction
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| 2012 | Agilent Technologies
ICP/OES
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ICP/OES
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Agilent Technologies
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Fitted Background Correction (FBC)— fast, accurate and fully-automated background correction
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| 2014 | Agilent Technologies
ICP/OES
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ICP/OES
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Agilent Technologies
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Shimadzu MXF-2400 X-ray Fluorescence Spectrometer
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| 2015 | Shimadzu
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Selection of Operating Parameters for a New Boosted-Discharge Bismuth Lamp
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| 2010 | Agilent Technologies
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Comparison of Calibration Curves of Lead, Cadmium and Chromium in Zinc Alloy and Copper Alloy
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| N/A | Shimadzu
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Shimadzu
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FTIR and UV-Vis Technology for Art Conservation
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| 2015 | Agilent Technologies
UV–VIS spectrophotometry, FTIR Spectroscopy
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UV–VIS spectrophotometry, FTIR Spectroscopy
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Agilent Technologies
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Mn Analysis by Atomic Absorption
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| N/A | Shimadzu
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Shimadzu
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