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Quantifying Copper Nanoparticles on Plant Leaves using Single-Particle ICP-MS
Applications
| 2018 | Agilent Technologies
ICP/MS
Instrumentation
ICP/MS
Manufacturer
Agilent Technologies
Industries
Food & Agriculture
Ceramic Analysis by EDXRF
Applications
| 2019 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Materials Testing
Analysis of Electroceramics by Laser Ablation ICP-MS
Applications
| 2004 | Agilent Technologies
ICP/MS, Laser ablation
Instrumentation
ICP/MS, Laser ablation
Manufacturer
Agilent Technologies
Industries
Semiconductor Analysis
Analysis of Precious Stones by EDX-8100
Applications
| 2020 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Environmental
Agilent 8800 Triple Quadrupole ICP-MS: Understanding oxygen reaction mode in ICP-MS/MS
Technical notes
| 2012 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Determination of Arsenic and Lead in Earth and Sand Using EDXRF [JIS K 0470]
Applications
| 2015 | Shimadzu
X-ray
Instrumentation
X-ray
Manufacturer
Shimadzu
Industries
Environmental
Analysis of Inorganic Additives in Resin by FTIR and EDX
Applications
| 2015 | Shimadzu
FTIR Spectroscopy, X-ray
Instrumentation
FTIR Spectroscopy, X-ray
Manufacturer
Shimadzu
Industries
Energy & Chemicals
TC Measurement and Elemental Composition Analysis of Fly Ash – Quantitation by TOC and XRF
Applications
| 2013 | Shimadzu
X-ray, TOC
Instrumentation
X-ray, TOC
Manufacturer
Shimadzu
Industries
Energy & Chemicals
WCPS: Determination of ultra-trace level impurities in high-purity metal samples by ICP-QQQ
Posters
| 2017 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Materials Testing
Analysis of Ultratrace Impurities in High Purity Copper using the Agilent 8900 ICP-QQQ
Applications
| 2018 | Agilent Technologies
ICP/MS, ICP/MS/MS
Instrumentation
ICP/MS, ICP/MS/MS
Manufacturer
Agilent Technologies
Industries
Energy & Chemicals , Semiconductor Analysis
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